<?xml version="1.0" encoding="UTF-8"?>
<XML><RECORDS>
<RECORD>
	<REFERENCE_TYPE>0</REFERENCE_TYPE>
	<AUTHORS>
		<AUTHOR>Feldman, Y</AUTHOR>
		<AUTHOR>Andrianov, A</AUTHOR>
		<AUTHOR>Polygalov, E</AUTHOR>
		<AUTHOR>Ermolina, I</AUTHOR>
		<AUTHOR>Romanychev, G</AUTHOR>
		<AUTHOR>Zuev, Y</AUTHOR>
		<AUTHOR>Milgotin, B</AUTHOR>
	</AUTHORS>
	<YEAR>1996</YEAR>
	<TITLE>Time domain dielectric spectroscopy: An advanced measuring system</TITLE>
	<SECONDARY_TITLE>REVIEW OF SCIENTIFIC INSTRUMENTS</SECONDARY_TITLE>
	<VOLUME>67</VOLUME>
	<PAGES>3208-3216</PAGES>
	<DATE>SEP</DATE>
	<ABSTRACT>The new time domain measurement system for dielectric measurements is
   described. The current model is comprised of an IBM PC-AT/486,
   `'TDM-2,'' a new time domain measurement system, a set of
   thermostabilized sample holders, and operation and analysis software.
   This system is designed for use in the measurement of dielectric
   parameters of liquid and solid materials over the frequency range 100
   kHz-10 GHz. Software consists of programs of registration, accumulation
   and data collection, Fourier analysis, time domain treatment, analysis
   software: fast and reliable nonlinear curve fitting programs to
   determine spectroscopic parameters and correlation analysis in time
   domain. The system utilizes the difference method of measurement with
   the registration of primary signals with multiwindow nonuniform
   sampling. Such a system permits the overlap of a frequency range of
   five orders in a single measurement. (C) 1996 American Institute of
   Physics.</ABSTRACT>
</RECORD>
</RECORDS></XML>
